478 XXXI International Mineral Processing Congress 2024 Proceedings/Washington, DC/Sep 29–Oct 3
and Kasal, 2016 Jogikalmath et al., 1999 Kappl and Butt,
2002 Karoussi and Hamouda, 2008 Marti, 2000]. This is
sometimes called colloidal probe microscopy [Kappl and
Butt, 2002].
In addition to the typical advantages inherent to AFM,
such as nanometer scale resolution, the advantages of uti-
lizing AFM for adhesion measurements include the ability
to map the adhesion in the surface area studied. With our
AFM, up to 512 force measurements can be made per
line. At this level, adhesion force measurements are made
approximately every 20 nm along each line raster scan.
The first stage in this research was to measure the water
contact angle of the treated discs to ensure that the treat-
ments were done similar to our previous research. Table 1
Figure 1. Focused ion beam (FIB) manufactured tip
Figure 2. Schematic representations of the AFM detector signal (left) and force-displacement curves
(right). Red indicates the tip is approaching the surface, while blue shows the tip is retracting from
the surface. B is the snap in to, and E, the pull-off of the tip from the surface. Point A shows the tip
far from the surface, C and D show the tip moving in contact with the surface
and Kasal, 2016 Jogikalmath et al., 1999 Kappl and Butt,
2002 Karoussi and Hamouda, 2008 Marti, 2000]. This is
sometimes called colloidal probe microscopy [Kappl and
Butt, 2002].
In addition to the typical advantages inherent to AFM,
such as nanometer scale resolution, the advantages of uti-
lizing AFM for adhesion measurements include the ability
to map the adhesion in the surface area studied. With our
AFM, up to 512 force measurements can be made per
line. At this level, adhesion force measurements are made
approximately every 20 nm along each line raster scan.
The first stage in this research was to measure the water
contact angle of the treated discs to ensure that the treat-
ments were done similar to our previous research. Table 1
Figure 1. Focused ion beam (FIB) manufactured tip
Figure 2. Schematic representations of the AFM detector signal (left) and force-displacement curves
(right). Red indicates the tip is approaching the surface, while blue shows the tip is retracting from
the surface. B is the snap in to, and E, the pull-off of the tip from the surface. Point A shows the tip
far from the surface, C and D show the tip moving in contact with the surface